System That Detects Ultra-Trace Concentrations Not Previously Possible
To maximize the benefits of the Off-Axis Ion Optics, the system features three noise-reduction technologies and a detector with improved amplification performance. Due to these state-of-the-art technologies, the system can reliably detect ultra-trace femtogram-level quantities of ions. The resulting exceptional analytical sensitivity and robustness increase the value of solutions and open the door to new applications.
The GCMS-TQ8050 NX detects peaks more reliably than the GCMS-TQ8040 NX, even for substances with fewer ions reaching the detector. That means it can reliably analyze femtogram-level concentrations with fewer ions.
Installing two lenses (overdrive lenses) in front of the electron multiplier reduces random noise from helium or argon and improves S/N. Applying voltage to the lenses improves S/N levels by reducing noise near the lenses and helping to focus the ions that pass through the mass filter (Patent No. US6737644).
The newly designed high-sensitivity detector offers excellent reliability even for samples with femtogram-level concentrations of trace components, achieving sub-femtogram IDL* levels.
*IDL: Instrument Detection Limit
The superior data stability with the GCMS-TQ8050 NX provides sensitivity that rivals high-resolution GC-MS analysis. This powerful new analytical instrument reliably identifies peaks even for trace quantities of dioxins and other substances previously considered difficult to analyze using a quadrupole GC-MS system.
Due to their tendency to resist degradation and remain inside organisms, the use of PFOS, PFOA, and other long-chain perfluorinated chemicals (PFCs) is increasingly being restricted. Because perfluorooctanesulfonamide and telomer alcohol have been identified as potentially breaking down to PFOS or PFOA, they have attracted attention as compounds that should be monitored in the environment, which involves monitoring trace concentrations.