Unrivaled Analytical Performance

Unrivaled Analytical Performance

The high-performance SDD detector and optimized hardware achieve a high level of sensitivity, analysis speed, and energy resolution that were previously unattainable. The EDX-8000/8100 system also permits detection from 6C.

High Sensitivity − Lower Limit of Detection Improved 1.5 to 5 Times! −

The high-performance SDD detector and combination of optimized optics and primary filters achieve previously unheard-of high levels of sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range from light to heavy elements.

High Speed − Throughput Increased by up to a Factor of 10 −

The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time. This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the Main component element.

Relationship Between Measurement Time and Standard Deviation
(Variance in Quantitation Values)


Comparison Using Actual Samples

Sample External Appearance

Repeatability using the EDX-7000/8000/8100 and the previous model were compared for lead (Pb) in lead-free solder.




Extending the Measurement time to increase the fluorescent X-ray count can improve the precision (repeatability) of X-ray fluorescence spectrometry. The EDX-7000/8000/8100 incorporate a high-count-rate SDD detector that achieves highly precise analysis of the target in a shorter Measurement time than the previous model.


High Resolution

The EDX-7000/8000/8100 instruments achieve superior energy resolution compared to previous models by incorporating a state-of-the-art SDD detector. This reduces the effects of overlapping peaks of different elements, enhancing the reliability of the analysis results.



Range of Detected Elements

  • An optional vacuum measurement unit or helium purge unit is required to measure light elements (15P and below) with the EDX-7000/8100.
  • An optional vacuum measurement unit is required to measure light elements (15P and below) with the EDX-8000.
  • Lower detection limit vary depending on the sample matrix or coexisting elements.
  • Lower detection limit of light element (20Ca and below) get worse when the sample cell film is used.
  • It is impossible to measure 8O and below with sample cell film.

Ultra-Light Element Analysis by EDX-8000/8100  

The EDX-8000/8100 features an SDD detector with a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F)

For Research Use Only. Not for use in diagnostic procedures.

This page may contain references to products that are not available in your country.
Please contact us to check the availability of these products in your country.

Top of This Page