AIRsight
Infrared Spectroscopy and Raman Spectroscopy
![AIRsight]](https://www.shimadzu.com/an/sites/shimadzu.com.an/files/d7/ckeditor/molecular_spectro/raman_spectro/AIRsight/top.jpg)
Infrared and Raman Microscope Based on a Combination of Two Analytical Techniques to Provide Complementary Molecular Information.
This simple system improves the efficiency of analytical operations by making it easy to perform all process steps from sample observation to data analysis.
Examples of Problems Solved

No liquid nitrogen required.
New detector capable of infrared microscopy measurements of minute samples.
Equipping the AIMsight Infrared Microscope with the TEC MCT (peltier cooled MCT) detector makes it possible to obtain infrared spectra without using liquid nitrogen. If more sensitivity is required, simply switch to the standard T2SL*1 detector in the software.
*1: Liquid nitrogen is required when using the T2SL.
Our Two-in-One Solution
This infographic provides a concise concept of our two-in-one solution by combining both IR and Raman analytical techniques into a single instrument.
Features
Videos
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AIRsight
Infrared Raman Microscopy AIRsight is a microscope system that can perform two analytical methods, infrared spectroscopy and Raman spectroscopy, in the same instrument. This video is an overview of the features of the device.
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Infrared and Raman Microscope AIRsight [Basic Usage]
Infrared Raman Microscopy AIRsight is a microscope system that can perform two analytical methods, infrared spectroscopy and Raman spectroscopy, in the same instrument. This video shows the basic use of infrared and Raman measurements.
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Perform Microplastics Analysis More Quickly and Accurately
By installing a particle analysis program in the AMsolution software for AIMsight (Infrared microscope) and AIRsight (Infrared Raman microscope), it is possible to calculate the qualitative characteristics of each particle, as well as their major and minor diameters, mass, and volume, from the chemical images obtained through mapping measurements.In addition, the High-Speed Mapping Program reduces measurement time. The use of a PF (Particle Filter) holder improves measurement accuracy, supporting microplastic and contaminant analysis using infrared microscopes.
