Relative Specular Reflectance Measurement
With relative specular reflectance measurement, the reflectance is calculated from the strength ratio after comparing the light reflected from the reference sample with the light reflected from the measurement sample. As shown in the figure, the reflectance of the reference sample is taken to be 100%, and the reflectance of the sample with respect to this reference sample is measured. This method is often applied to the examination of semiconductors, optical materials and multi-layer films.
This attachment measures the relative reflectance of specular reflected light. The 5° angle of incidence minimizes the influence of polarized light, so a polarizer is not needed, which facilitates measurement.
- For UVmini, UV-1900i/2600i/2700i/3600i Plus series and SolidSpec
- Maximum sample size: 160 mm H x 100 mm W x 15 mm T (when used on UVmini series, UV-1800) 160 mm H x 140 mm W x 10 mm T (when used on UV-2450/2550/2600/2700/3600) 160 mm H x 140 mm W x 15 mm T (when used on SolidSpec-3700)
- Minimum sample size: 7 mm dia. (when 5 mm dia. beam is used)
*)When used on the UVmini series, the sample compartment unit is required. When used on the SolidSpec-3700, the direct detection unit is required.
This attachment is required when relative specular reflectance is measured on the SolidSpec-3700/3700DUV.
It ensures that reflectance measurement is performed with samples kept horizontal.
- Maximum sample size: 470 mm W x 560 mm D x 40 mm T
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